Atomic force microscope LAFM-A10

Overview

Atomic force microscope LAFM-A10 comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It’s equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.

Specifications :

Operation modes	Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Scan angle	Random angle
Maximum scan range	X/Y axis: 20 µm, Z axis: 2 µm
Optical system/ Magnification of CCD	Magnification: 4x, Resolution: 2.5 µm
Resolution	X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size	Ø≤ 90 mm, H≤ 20 mm
Sample movement	0 to 20 mm
Pulse width of approaching motor	10 ± 2 ms
Scan rate	0.6 Hz to 4.34 Hz
Scanning control	XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel	256×256, 512×512
Feedback type	DSP digital feedback
Feedback sampling rate	64 KHz
PC connections:	USB 2.0
Windows software	Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion	415 × 410 × 545 mm
Net weight	40 kg
Gross Weight	50 kg

Features :

• -  Large range of sample transfer
• -  Modular electronic system for easy maintenance
• -  Adopted with spring for vibration isolation
• -  Provides highly accurate results
• -  Optical observation system for checking tip & sample’s position